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International metrology congress: call for papers now open
The 17 th CIM (Congrès International de Métrologie – International metrology congress) will be held in Paris (France) from 21 to 24 September 2015. For this new edition, the organisers are launching a call for papers on such major topics as measuring, analysing and testing, process control, measuring trades, regulatory fields, legal metrology and international recognition, new metrology and new sectors.
The deadline for filing proposals is set to 15 December 2014.
For further information and registration form, click here
(11/06/2014)
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