Mecatheque
Results of collective works
International Metrology Congress Paris – Porte de Versailles, 21-24 September 2015
This document provides a summary review of the last International Metrology Congress (organised every two years by the French Metrology College) and highlights the technical topics considered most relevant for the mechanical industry. Accordingly, it covers a series of 14 summarised presentations (challenges, work performed, results, conclusion and perspectives), illustrating the recent trends in 3D metrology (Lean Manufacturing, CMM, 3D imaging, profile measurement, submicrometric measurement), measurement and characterisation in nanotechnology, control of uncertainty, inspection requirements in additive manufacturing, non-intrusive temperature measurement (in a nuclear plant) and, finally, the applications of metrology in the field of MRI and sensory perception (haptic) of a material.
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